Standard ICT Test Probes - 100mil - Flat Tip (FA)
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Passive Flat Tip (FA) has a smooth surface and leaves no mark on the Test Pads after test.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Passive Flat Tip (FA) has a smooth surface and leaves no mark on the Test Pads after test.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Passive Flat Tip (FA) has a smooth surface and leaves no mark on the Test Pads after test.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs that have been manufactured with bead probe technology
Tip Diameter
FA: 1.5mm
Technical Specifications
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
