Standard ICT Test Probes - 100mil - Engraver (EC, ER )
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Engraver Tip on theEC and ER versions provide a tri sided tip for use with Open Via’s and test pads and have three contacting edges .
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Engraver Tip on theEC and ER versions provide a tri sided tip for use with Open Via’s and test pads and have three contacting edges .
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Engraver Tip on theEC and ER versions provide a tri sided tip for use with Open Via’s and test pads and have three contacting edges .
Key Features -
High contact accuracy
Long life expectancy
Tip Diameter
EC 0.91mm
ER 1.5mm
Typical Applications -
ICT Test Fixtures for PCBs that have been manufactured requiring probing of open vias. These probes typically have an aggressive tip type.
Technical Specification
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
