Standard ICT Test Probes - 100mil - Lead Free (LA, LB, LC, LF)
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB, LC and LF versions provided dagger tips of different profiles for use with Lead Free Solder materials.
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB, LC and LF versions provided dagger tips of different profiles for use with Lead Free Solder materials.
These 100 mil Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The Lead Free Tip on the LA, LB, LC and LF versions provided dagger tips of different profiles for use with Lead Free Solder materials.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs that have been manufactured with Lead Free solder materials. These probes typically have a more aggressive tip type.
Technical Specification
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
