Standard ICT Test Probes - 100mil - Crown (CA, CB, CC, CG)
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.
These Spring-loaded Test Probes typically used in ICT Test Fixtures (Bed of Nails). They have high hitting accuracy and long-life expectancy. The 4 Point Crown Tip on the CA, CB and CC versions make good component pin contact. the CG version has a multipoint tip and can be used in a wide range of applications. The CC version of the pin is also self cleaning.
Key Features -
High contact accuracy
Long life expectancy
Typical Applications -
ICT Test Fixtures for PCBs that have been manufactured with bead probe technology
Technical Specification
Delivery: Stock items despatched within 1 to 2 days from date of Order
Non Stock Items despatched approximately 2 weeks from date of order
Pricing is for quantities up to 1000 units. Contact us for pricing on higher volumes.
